Lois Diane Harper Walsh is a retired researcher for the Air Force Research Laboratory (AFRL). Originally a materials scientist, she became branch chief for advanced computing at the AFRL Rome Laboratory.

Walsh earned a master's degree from Syracuse University in 1984, with the master's thesis Microstructural characterization of Copper films deposited in Titanium substrates.[1] By the time she completed her Ph.D. in solid state science at Syracuse in 1989, she was already working at the Rome laboratory (then known as the Rome Air Development Center), and married with two children. Her dissertation, The interaction of polycrystalline copper films with dilute aqueous solutions of cupric chloride, was supervised by James A. Schwarz, a Syracuse professor of chemical engineering and materials science.[2]

In 2005, Walsh was named an IEEE Fellow "for leadership in electronic device reliability".[3] At this point she was branch chief for advanced computing at the Rome Laboratory, in charge of a team of 30 staff researchers, and had fostered collaborations between them and "numerous extramural researchers and university faculty". Her work involved not only device reliability, based on "innovative surface analysis and diagnostic techniques", but also high performance computing, quantum computing, and biologically inspired nanotechnology.[4]

References

  1. ↑ WorldCat catalog entry for Microstructural characterization of Copper films deposited in Titanium substrates, accessed 2021-10-06
  2. ↑ WorldCat catalog entry for The interaction of polycrystalline copper films with dilute aqueous solutions of cupric chloride, accessed 2021-10-06; Walsh, Lois Harper (October 1989), The interaction of polycrystalline copper films with dilute aqueous solutions of cupric chloride (PDF) (In-house report), Rome Air Development Center, Bibcode:1989PhDT........23W, RADC TR-89-202, archived (PDF) from the original on 2021-10-06 (see especially preface, p. iv)
  3. ↑ IEEE Fellows directory, IEEE, retrieved 2021-10-06
  4. ↑ Regulinski, Thad L. D. (May 2005), "Drs. Walsh and Pham Are Recipients of 2005 Fellow Honors" (PDF), IEEE Reliability Society Newsletter, 51 (2)
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